A Comparison of Rutherford Backscattering Spectroscopy and X-Ray Diffraction to Determine the Composition of Thick InGaN Epilayers

2001 ◽  
Vol 228 (1) ◽  
pp. 41-44 ◽  
Author(s):  
S. Srinivasan ◽  
R. Liu ◽  
F. Bertram ◽  
F.A. Ponce ◽  
S. Tanaka ◽  
...  
Keyword(s):  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray

Thin-film reactions of Au with Ti, Zr, V, and Nb

1987 ◽  
Vol 2 (1) ◽  
pp. 28-34 ◽  
Author(s):  
E. G. Colgan ◽  
J. W. Mayer
Keyword(s):  
Thin Film ◽  
Phase Diagrams ◽  
Intermetallic Phases ◽  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Layer By Layer ◽  
X Ray Diffraction ◽  
Rich Phase ◽  
X Ray

The thin-film interactions of Au with Ti, Zr, V, and Nb have been investigated between 350C and 700°C with Rutherford backscattering spectroscopy (RBS) and x-ray diffraction (XRD). Initially the most Au-rich phase is formed, except. with V, and it is followed sequentially by the more metal-rich ones in an increasingly layer-by-layer fashion. For Au reactions on Ti and Nb, all the intermetallic phases on the phase diagrams were observed. In the formation of Au4Ti, Au is the dominant moving species.

Sign in / Sign up

Export Citation Format

Share Document